English / Japanese
2010”N“x IEEEŠÖ¼Žx•”Šw¶Œ¤‹†§—ãÜ
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- Marie Engelene J. Obieni”ŽŽmŒãŠú‰Û’ö3”Nj
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- Marie Engelene J. Obien, Satoshi Ohtake, and Hideo Fujiwara, "Constrained ATPG for Functional RTL Circuits Using F-Scan," 2010 IEEE International Test Conference, Paper 21.1, Nov. 2010.
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- •½¬ 23 ”N 2 ŒŽ
IEEE WRTLT 2008 Best Paper Award
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- “¡Œ´ G—Y ‹³Žö
- Chia Yee Ooi(uŽt, ƒ}ƒŒ[ƒVƒAH‰È‘åŠw)
- ´…—S‹I(•½¬21”N”ŽŽm‘OŠú‰Û’öC—¹¶)
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- Hideo Fujiwara, Chia Yee Ooi, and Yuki Shimizu, "Enhancement of Test Environment Generation for Assignment Decision Diagrams"
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- •½¬ 21 ”N 11 ŒŽ
IEEE ASICON 2009 Excellent Student Paper Award
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- Marie Engelene J. Obien(”ŽŽmŒãŠú‰Û’ö‚Q”N)
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- Marie Engelene J. Obien and Hideo Fujiwara, "F-Scan: An Approach to Functional RTL Scan for Assignment Decision Diagrams", Proc. IEEE 8th International Conference on ASIC (ASICON2009), pp. 589- 592, Oct. 2009.
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- •½¬ 21 ”N 10 ŒŽ
IEEE Computer Society Outstanding Contribution Award
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- “¡Œ´ G—Y ‹³Žö
- ŽóÜ”NŒŽF
- •½¬ 21 ”N 5 ŒŽ
IEEE WRTLT 2007 Best Paper Award
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- ‹gì —SŽ÷ •‹³(‘²‹Æ¶FŒ»L“‡Žs—§‘åŠw)
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- “¡Œ´ G—Y ‹³Žö
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- Yuki Yoshikawa, Satoshi Ohtake and Hideo Fujiwara, "RTL Don't Care Path Identification and Synthesis for Transforming Don't Care Paths into False Paths"
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- •½¬ 20 ”N 11 ŒŽ
2007”N“x IEEEŠÖ¼Žx•”Šw¶Œ¤‹†§—ãÜ
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- Fawnizu Azmadi HUSSINi”ŽŽmŒãŠú‰Û’ö3”Nj
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- Fawnizu Azmadi Hussin, Tomokazu Yoneda, and Hideo Fujiwara, "Optimization of NoC Wrapper Design under Bandwidth and Test Time Constraints," Proceeding of the IEEE European Test Symposium 2007, pp. 35-40, May, 2007.
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- •½¬ 20 ”N 2 ŒŽ
2006”N“x IPSJ Digital Courier‘DˆäŽáŽè§—ãÜ
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- ‹gì—SŽ÷i”ŽŽmŒãŠú‰Û’ö2”Nj
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- Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, and Hideo Fujiwara, "Non-scan Design for Single-Port-Change Delay Fault Testability," Information Processing Society of Japan, Vol. 47, No. 6, pp. 1619-1628, June 2006.
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- •½¬ 19 ”N 3 ŒŽ
2006”N“x IEEEŠÖ¼Žx•”Šw¶Œ¤‹†§—ãÜ
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- ‹gì—SŽ÷i”ŽŽmŒãŠú‰Û’ö2”Nj
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- Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, and Hideo Fujiwara, "Design for Testability Based on Single-Port-Change Delay Testing for Data Paths," Proceedings of IEEE the 14th Asian Test Symposium 2005 (ATS'05), pp. 254-259, Dec. 2005.
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- •½¬ 19 ”N 2 ŒŽ
IEEE WRTLT 2005 Best Paper Award
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- ’†—¢ ¹l i”ŽŽmŒãŠú‰Û’ö‚Q”Nj
- ‘å’| “NŽj •Žè
- Kewal K. Saluja ‹³Žö iƒEƒBƒXƒRƒ“ƒVƒ“‘åŠwj
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- Masato Nakazato, Satoshi Ohtake, Kewal K. Saluja and Hideo Fujiwara "Acceleration of Test Generation for Sequential Circuits Using Knowledge Obtained from Synthesis for Testability," Proc. of IEEE 6th Workshop on RTL and High Level Testing (WRTLT'05), pp.50-60, June 2005.
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- •½¬ 18 ”N 11 ŒŽ
2005”N“x IEEEŠÖ¼Žx•”Šw¶Œ¤‹†§—ãÜ
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- ’†—¢¹li”ŽŽmŒãŠú‰Û’ö‚P”Nj
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- Masato Nakazato, Satoshi Ohtake, Kewal K. Saluja and Hideo Fujiwara "Acceleration of Test Generation for Sequential Circuits Using Knowledge Obtained from Synthesis for Testability," Proc. of IEEE 6th Workshop on RTL and High Level Testing (WRTLT'05), pp.50-60, June 2005.
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- •½¬ 18 ”N 2 ŒŽ
IEEE DELTA 2006 Best Paper Award
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- Michel Renovell ‹³Žöiƒ‚ƒ“ƒyƒŠƒG‘æ“ñ‘åŠw LIRMMŒ¤‹†ŠCƒtƒ‰ƒ“ƒXj
- Mariane Comte ”ŽŽmiNAIST-COE ƒ|ƒXƒgƒhƒNŒ¤‹†ˆõGŒ»ÝAƒ‚ƒ“ƒyƒŠƒG‘æ“ñ‘åŠw LIRMMŒ¤‹†Š•‹³ŽöCƒtƒ‰ƒ“ƒXj
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- Michel Renovell, Mariane Comte, Satoshi Ohtake and Hideo Fujiwara, "Electrical Behavior of GOS Fault affected Domino Logic Cell," Third IEEE International Workshop on Electronic Design, Test & Applications (DELTA 2006),17-19 Jan. 2006
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- •½¬ 18 ”N 1 ŒŽ
IEEE Computer Society Meritorious Service Award
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- “¡Œ´ G—Y ‹³Žö
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- •½¬ 17 ”N 11 ŒŽ
IEEE Computer Society Continuing Service Award
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- “¡Œ´ G—Y ‹³Žö
- ŽóÜ”NŒŽF
- •½¬ 17 ”N 11 ŒŽ
IEEE ŠÖ¼Žx•”Šw¶Œ¤‹†§—ãÜ
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- ŠâŠ_ „i–{Œ¤‹†‰È”ñí‹ÎŒ¤‹†ˆõC•½¬ 16 ”N 9 ŒŽ–{Œ¤‹†‰È”ŽŽmŒãŠú‰Û’öC—¹j
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- Tsuyoshi Iwagaki, Satoshi Ohtake and Hideo Fujiwara, "A design methodology to realize delay testable controllers using state transition information," Proc. 9th IEEE European Test Symposium (ETS '04), pp. 168-173, May 2004.
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- •½¬ 17 ”N 2 ŒŽ
IEEE ATS'02 Best Paper Award
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- Erik Larsson ”ŽŽmi“ú–{ŠwpU‹»‰ïŠO‘l“Á•ÊŒ¤‹†ŽÒGŒ»ÝALinkoeping Univ. •‹³ŽöAƒXƒG[ƒfƒ“j
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- Erik Larsson, Klas Arvidsson, Hideo Fujiwara and Zebo Peng, "Integrated Test Scheduling, Test Parallelization and TAM Design," Proc. of IEEE the 11th Asian Test Symposium (ATS'02), pp. 397-404, Nov. 2002.
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- •½¬ 16 ”N 11 ŒŽ
IEEE WRTLT '03 Best Paper Award
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- ŠâŠ_ „i–{Œ¤‹†‰È”ñí‹ÎŒ¤‹†ˆõC•½¬ 16 ”N 9 ŒŽ–{Œ¤‹†‰È”ŽŽmŒãŠú‰Û’öC—¹j
- ‘å’| “NŽj •Žè
- “¡Œ´ G—Y ‹³Žö
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- Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara, "An approach to non-scan design for delay fault testability of controllers," Digest of Papers IEEE the 4th Workshop on RTL and High Level Testing (WRTLT '03), pp. 79-85, Nov. 2003.
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- •½¬ 16 ”N 11 ŒŽ
î•ñˆ—Šw‰ïƒtƒFƒ[̆
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- “¡Œ´ G—Y ‹³Žö
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- •½¬ 16 ”N 3 ŒŽ
•½¬ 13 ”N“x“dŽqî•ñ’ÊMŠw‰ïî•ñƒVƒXƒeƒ€ƒ\ƒTƒCƒGƒeƒB˜_•¶Ü
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- “¡Œ´ G—Y ‹³Žö
- ‘å’| “NŽj •Žè
- Kewal K. Saluja iƒEƒBƒXƒRƒ“ƒVƒ“‘åŠw‹³Žöj
- ‘àV —˜Œõi‘åã‘åŠw‹³ŽöF“–Žž–{Œ¤‹†‰È•‹³Žöj
- ‚è ’q–çiƒVƒƒ[ƒvДޮ‰ïŽÐF•½¬ 12 ”N 3 ŒŽ–{Œ¤‹†‰È”ŽŽmŒãŠú‰Û’öC—¹j
- ˜a“c OŽ÷iДޮ‰ïŽÐ“ú—§»ìŠF•½¬ 13 ”N 3 ŒŽ–{Œ¤‹†‰È”ŽŽmŒãŠú‰Û’öC—¹j
- ‰iˆä T‘¾˜Yi¼‰º“dŠíŽY‹ÆŠ”Ž®‰ïŽÐF•½¬ 15 ”N 3 ŒŽ–{Œ¤‹†‰È”ŽŽmŒãŠú‰Û’öC—¹j
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- •½¬ 14 ”N 9 ŒŽ
IEEE Computer Society Outstanding Contribution Award
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- •½¬ 13 ”N 11 ŒŽ
IEEE ATS '01 ŽR“c‹P•F‹L”OÜ
IEEE Computer Society Certificate of Appreciation Award
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- •½¬ 13 ”N 11 ŒŽ
“dŽqî•ñ’ÊMŠw‰ïƒtƒFƒ[̆
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- •½¬ 13 ”N 9 ŒŽ
î•ñ‰ÈŠwŒ¤‹†‰ÈÅ—DGŠw¶Ü
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- ‘å’| “NŽj •Žè
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- •½¬ 12 ”N 3 ŒŽ
IEEE Computer Society Certificate of Appreciation Award
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- •½¬12”N10ŒŽ
1999”N•À—ñˆ—ƒVƒ“ƒ|ƒWƒEƒ€ JSPP '99 Å—DG˜_•¶Ü
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- “¡Œ´ ‹ÅGi‹ãBH‹Æ‘åŠw•‹³ŽöF•½¬ 9 ”N 3 ŒŽ–{Œ¤‹†‰È”ŽŽmŒãŠú‰Û’öC—¹j
- ˆäã ”ü’qŽq •‹³Žö
- ‘àV —˜Œõi‘åã‘åŠw‹³Žö : “–Žž–{Œ¤‹†‰È•‹³Žöj
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- •½¬ 11 ”N 6 ŒŽ
IEEE Computer Society Golden Core Member Award
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- “¡Œ´ G—Y ‹³Žö
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- •½¬ 9 ”N 12 ŒŽ
•½¬ 8 ”N“x“dŽqî•ñ’ÊMŠw‰ïŠwp§—ãÜ
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- ‚è ’q–ç (ƒVƒƒ[ƒvДޮ‰ïŽÐF•½¬ 12 ”N 3 ŒŽ–{Œ¤‹†‰È”ŽŽmŒãŠú‰Û’öC—¹)
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- •½¬ 9 ”N 3 ŒŽ
IEEE Computer Society Meritorious Service Award
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- “¡Œ´ G—Y ‹³Žö
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- •½¬ 8 ”N 11 ŒŽ
‘åìo”ÅÜ
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- “¡Œ´ G—Y ‹³Žö
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- •½¬ 6 ”N 11 ŒŽ
IEEE Computer Society Certificate of Appreciation Award
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- “¡Œ´ G—Y ‹³ŽöiŽóÜŽžF–¾Ž¡‘åŠw‹³Žöj
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- •½¬ 3 ”N 10 ŒŽ
IEEE Fellow Award
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- “¡Œ´ G—Y ‹³ŽöiŽóÜŽžF–¾Ž¡‘åŠw‹³Žöj
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- •½¬Œ³”N 1 ŒŽ
“dŽq’ÊMŠw‰ï Šwp§—ãÜ
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- “¡Œ´ G—Y ‹³ŽöiŽóÜŽžF‘åã‘åŠw•Žèj
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- º˜a 52 ”N 4 ŒŽ
